Friday, December 15, 2023 3:30pm to 5pm
About this Event
28 West Green Drive, Athens, Ohio 45701
Dissertation Title: Mixed Type Wafer Defect Pattern Recognition using Ensemble Deformable Convolutional Neural Networks for Chronic Manufacturing Process Quality Problem Reduction
Dissertation Advisor: Dr. Tao Uyan
Department: Mechanical & Systems Engineering
Date: December 15, 2023
Time: 3:30pm-5:00pm
Location: Stocker Center, Room 289
0 people are interested in this event
User Activity
No recent activity